Single-Event Effect Responses of Integrated Planar Inductors in 65-nm CMOS

This article describes a previously unreported single-event radiation effect in spiral inductors manufactured commercial CMOS technology when subjected to ionizing radiation. Inductors play major role as the component determining frequency of $LC$ tank oscillators, which is why any these passive components can have detrimental impact on performance clock generation circuits. Different experiments performed localize and characterize (SEE) response radiation-hardened PLL circuit are discussed presented together with hypothesis for underlying physical mechanism.